摘要： 在S参数的测量过程中，需通过去嵌方法去除测试夹具带来的结果误差。该算法通过时域的方法对夹具进行分解。接着将分解得到的夹具S参数采用ABCD矩阵运算进行去除，从而得到待测器件的S参数。通过设计测试板来进行实验，将该算法与传统的AFR和Delta L方法进行了比较，验证了该去嵌算法对高频信号的有效性以及准确性。同时由于该算法先分解再去嵌的特性，使其可应用于左右夹具不一致的情况。

中图分类号：TN402
文献标志码：A
DOI: 10.16157/j.issn.0258-7998.222935
中文引用格式： 纪萍，徐小明，朱国林，等. 一种用于高频S参数的去嵌算法[J]. 电子技术应用，2023，49(1)：130-134.
英文引用格式： Ji Ping，Xu Xiaoming，Zhu Guoling，et al. A method for de-embedding s-parameter with high-frequency[J]. Application of Electronic Technique，2023，49(1)：130-134.

A method for de-embedding s-parameter with high-frequency

Abstract： During the measurement of s-parameters, using the de-embedding method to remove the influence of fixture is important. The proposed method decomposes the s-parameter of fixture by time domains. Then the ABCD matric is used to remove the decomposed fixture and get the s-parameter of device under test. By designing printed circuit board to do some experiments, and compare the proposed method with the other two traditional methods, AFR and Delta L. The results prove that this method is valid and accurate under high-frequency signal. Due to the facture that the algorithm decomposes first and then de-embeds, it can be applied to the situation that the left and right fixture are different.

Key words : s-parameter；de-embedding；high-frequency；ABCD matric