摘要： 随着现代超大规模集成电路的电源网络变得十分复杂，在片上对其各电源域电压噪声功率谱的测量变得越来越有意义。片上电源电压噪声测量电路的设计难点主要是在面积和功耗开销较小的情况下，可以较高精度地测量频率范围很宽的电源噪声信号。介绍了基于自相关方法测量电源电压噪声功率谱的原理，并总结了目前用于电源电压噪声功率谱测量的主要电路技术，讨论了相关结构和技术的优缺点，为超大规模集成电路的设计研发人员提供了有益参考。

中图分类号： TN407
文献标识码： A
DOI：10.16157/j.issn.0258-7998.201215
中文引用格式： 翟鹏飞，周雄，李强. 片上电源电压噪声功率谱测量方法综述[J].电子技术应用，2021，47(8)：30-33，38.
英文引用格式： Zhai Pengfei，Zhou Xiong，Li Qiang. Review of on chip power supply noise power spectrum measurement[J]. Application of Electronic Technique，2021，47(8)：30-33，38.

Review of on chip power supply noise power spectrum measurement

Abstract： As the complexity of power delivery network in modern VLSI, the on-chip measurement of the noise power spectrum of each power domain becomes more meaningful. The difficulty of the on-chip power supply noise measurement is mainly to measure the noise in a very wide frequency range with high accuracy under the condition of small area and power consumption overhead. This paper introduces the principle of measuring the power supply noise spectrum based on the autocorrelation, and summarizes the main circuit techniques currently used for power supply noise measurement, and discusses the advantages and disadvantages of related structures, which provides a useful reference for VLSI designers.

Key words : power supply noise；power delivery network；power spectrum measurement；autocorrelation